• DocumentCode
    2774300
  • Title

    Analysis of the effect of bypass on the performance of heat sinks using flow network modeling (FNM)

  • Author

    Radmehr, Amir ; Kelkar, Kanchan M. ; Kelly, Patrick ; Patankar, Suhas V. ; Kang, Sukhwinder S.

  • Author_Institution
    Innovative Res. Inc., Minneapolis, MN, USA
  • fYear
    1999
  • fDate
    9-11 March 1999
  • Firstpage
    42
  • Lastpage
    47
  • Abstract
    Heat sinks are used in electronics cooling systems to provide extra area for transfer of the heat dissipated by semiconductor devices. However, in presence of clearance regions around the heat sink, flow that would otherwise go through the heat sink bypasses it. This study uses the technique of flow network modeling (FNM) to analyze the effect of flow bypass on the heat transfer performance of a plate fin heat sink. The physical situation analyzed corresponds to a typical wind tunnel test cell used for characterization of the heat sink performance. Results of network analysis predict that increasing the bypass region has a strong effect on decreasing the flow rate through the heat sink. Therefore, the effectiveness of the heat sink is reduced when large clearance regions are present around it. The network analysis is shown to be very easy, quick, and accurate. It can be used for analysis of the placement of heat sinks in practical cooling systems.
  • Keywords
    cooling; flow simulation; heat sinks; integrated circuit modelling; integrated circuit packaging; thermal management (packaging); bypass region; clearance regions; cooling systems; dissipated heat transfer; electronics cooling systems; flow bypass; flow bypass effects; flow network modeling; flow rate; heat sink clearance region; heat sink performance; heat sink placement; heat sinks; heat transfer performance; network analysis; plate fin heat sink; semiconductor devices; wind tunnel test cell; Electronics cooling; Heat sinks; Heat transfer; Performance analysis; Resistance heating; Semiconductor devices; Surface resistance; Temperature; Testing; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1999. Fifteenth Annual IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-5264-5
  • Type

    conf

  • DOI
    10.1109/STHERM.1999.762427
  • Filename
    762427