DocumentCode :
2774368
Title :
Power-supply instability aware clock signal modulation for digital integrated circuits
Author :
Semião, J. ; Freijedo, J. ; Moraes, M. ; Mallmann, M. ; Antunes, C. ; Rocha, L. ; Benfica, J. ; Vargas, F. ; Santos, M. ; Teixeira, I.C. ; Rodríguez Andina, J.J. ; Teixeira, J.P. ; Lupi, D. ; Gatti, E. ; Garcia, L. ; Hernandez, F.
Author_Institution :
UAlg / EST, Univ. of Algarve, Faro
fYear :
2008
fDate :
8-12 Sept. 2008
Firstpage :
1
Lastpage :
6
Abstract :
As IC technology scales down, interconnect issues are becoming one of the major concerns of gigahertz system-on-chip (SoC) design. Voltage distortion (power supply noise) and delay violations (signal and clock skews) dramatically contribute to signal integrity loss. As a consequence, performance degradation, reliability problems and ultimately, functional error occur. In this paper, we propose a new methodology to enhance SoC signal integrity with respect to power/ground voltage transients, without degrading its performance. The underlying principle of the proposed methodology is to dynamically adapt the clock duty-cycle (CDC) according to the signal propagation delay through the logic whose power supply voltage is being disturbed. The methodology is based on a clock stretching logic (CSL) block, which monitors abnormal power grid activity and increases clock duty-cycle accordingly. Moreover, a model to accurately quantify CDC stretching as a function of VDD/Gnd fluctuations is proposed. Practical experiments based on the implementation of a 32-bit pipeline processor in a FPGA IC were performed and demonstrate the circuit robustness enhancement to power line fluctuations while maintaining at-speed clock rate.
Keywords :
digital integrated circuits; field programmable gate arrays; integrated circuit reliability; system-on-chip; 32-bit pipeline processor; FPGA IC; IC technology; circuit robustness enhancement; clock duty-cycle; clock signal modulation; clock stretching logic block; delay violations; digital integrated circuits; field programmable gate arrays; functional error; gigahertz system-on-chip design; performance degradation; power grid activity; power line fluctuations; power supply instability; power supply noise; power supply voltage; power-ground voltage transients; reliability problems; signal propagation delay; Clocks; Degradation; Digital integrated circuits; Digital modulation; Fluctuations; Integrated circuit interconnections; Integrated circuit technology; Logic; Power supplies; Voltage; Clock Duty-Cycle Modulation; Power Supply Noise; Signal Integrity Increase; System-on-Chip (SoC);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location :
Hamburg
Print_ISBN :
978-1-4244-2737-6
Electronic_ISBN :
978-1-4244-2737-6
Type :
conf
DOI :
10.1109/EMCEUROPE.2008.4786876
Filename :
4786876
Link To Document :
بازگشت