Low power testing by test vector ordering with vector repetition

Test vector ordering with vector repetition has been presented as a method to reduce the average as well as the peak power dissipation of a circuit during testing. Based on this method, in this paper we present some techniques that can be used to further reduce the average power dissipation. Experimental results validate that the proposed techniques achieve considerable savings in energy and average power dissipation while reducing the length of the resulting test sequences compared to the original method.