Functional vector generation for combinational circuits based on data path coverage metric and mixed integer linear programming

Author

Sosa, J. ; Nelson, Juan A Montiel ; Navarro, H. ; Garcia, J.C.

Author_Institution

Dept. of Electron. Eng. & Autom., Univ. of Las Palmas de Gran Canaria, Spain

fYear

2004

fDate

2004

Firstpage

217

Lastpage

222

Abstract

In this paper a functional vector generation method to maximize the data path coverage of a combinational circuit is introduced. We present a new gate model based on sensitization requirements for transition propagation, and introduce a new methodology to obtain functional vectors of maximum coverage based on Mixed Integer Linear Programming (MILP). Performance comparison and results based on a large set of MCNC´91 benchmark circuits are given. Experimental results show significant speedups over a greedy SAT method.

Keywords

automatic test pattern generation; combinational circuits; computational complexity; data flow graphs; integer programming; linear programming; logic testing; Boolean network; benchmark circuits; combinational circuits; computational complexity; data path coverage metric; functional vector generation; gate model; graph definitions; maximum coverage; mixed integer linear programming; satisfiability conditions; sensitization requirements; transition propagation; Automation; Circuit simulation; Circuit testing; Combinational circuits; Computer bugs; Data engineering; Logic; Microelectronics; Mixed integer linear programming; Vectors;

fLanguage

English

Publisher

ieee

Conference_Titel

Quality Electronic Design, 2004. Proceedings. 5th International Symposium on

Print_ISBN

0-7695-2093-6

Type

conf

DOI

10.1109/ISQED.2004.1283676

Filename

1283676