Title :
Applying IEC 62132-2 to the real world: Immunity of an analogue to digital converter
Author :
Aurand, Tobias ; Dawson, John F. ; Robinson, Martin P. ; Marvin, Andrew C.
Author_Institution :
Appl. Electromagn. Res. Group, Univ. of York, York
Abstract :
The susceptibility of an analogue to digital (A/D) converter was measured according to IEC 62132-2 (TEM cell). The chip on its own had a high immunity as the lead-frame presents a small loop area and picks up little energy from an interfering source. With a small (15 mm) track added the immunity was greatly reduced and showed a number that the interference had least effect at harmonics of the A/D converter clock frequency.
Keywords :
IEC standards; analogue-digital conversion; immunity testing; integrated circuit testing; IEC 62132-2; TEM cell; analogue-to-digital converter; immunity testing; Analog-digital conversion; Clocks; Frequency conversion; IEC standards; Integrated circuit testing; Interference; Measurement standards; Performance evaluation; Radio frequency; TEM cells; IC immunity; IEC 62132; TEM cell;
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location :
Hamburg
Print_ISBN :
978-1-4244-2737-6
Electronic_ISBN :
978-1-4244-2737-6
DOI :
10.1109/EMCEUROPE.2008.4786880
