DocumentCode :
2774471
Title :
Thermal management of heat spreader materials for flip chip type package
Author :
Hirose, Yoshiyuki ; Yamagata, Shin-ichi ; Imamura, Makoto ; Abe, Yugaku ; Fukui, Akira ; Shimazu, Mitsuru ; Fujimori, Naoji
Author_Institution :
Sumitomo Electr. Ind. Ltd., Hyogo, Japan
fYear :
1999
fDate :
9-11 March 1999
Firstpage :
105
Lastpage :
112
Abstract :
The heat spreader for the organic package in a flip chip assembly was investigated. The thermal management analysis, which is based on thermal simulation techniques and an experimental database, was applied to find suitable materials for the heat spreader. We successfully accomplished the simulation technique for the thermal management, which is consistent with the experimental results. We revealed that the critical stress in the die attach resin should be less than 2 kgf/mm/sup 2/ through this technique. We also revealed that the CTE of the heat spreader material should range from 8 to 16 ppm/K. This value of CTE supports the proposal that sintered Al-SiC is suitable as a heat spreader material for an organic package with flip chip assembly. Furthermore, the adhesive strength of Al-SiC with the resin is strong enough to be used as the heat spreader material.
Keywords :
adhesion; aluminium; circuit simulation; composite materials; flip-chip devices; heat sinks; integrated circuit bonding; integrated circuit modelling; integrated circuit packaging; microassembling; silicon compounds; sintering; stress analysis; thermal analysis; thermal expansion; thermal management (packaging); thermal stresses; Al-SiC; adhesive strength; critical stress; die attach resin; experimental database; flip chip assembly; flip chip type package; heat spreader; heat spreader material CTE; heat spreader materials; organic package; sintered Al-SiC heat spreader material; thermal management; thermal management analysis; thermal simulation techniques; Analytical models; Assembly; Databases; Flip chip; Microassembly; Organic materials; Packaging; Resins; Thermal management; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1999. Fifteenth Annual IEEE
Conference_Location :
San Diego, CA, USA
ISSN :
1065-2221
Print_ISBN :
0-7803-5264-5
Type :
conf
DOI :
10.1109/STHERM.1999.762435
Filename :
762435
Link To Document :
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