Title :
An electronic calibrating system to increase measurements accuracy during aerospace payload transfer operations
Author :
Toro, Felix A Soto ; Mikhael, Wash B.
Author_Institution :
NASA, Kennedy Space Center, FL, USA
Abstract :
NASA at Kennedy Space Center conducts multiple payload transfer operations for each space launch, These operations require the mating of multiple payload trunnions to simultaneously latch to the cargo bay. Today, payload technicians help with the guiding of these operations by informing the payload conductor about the offset distances between the payload trunnions and the cargo bay latch. These crane transfer operations are hazardous and time consuming. A simple, robust, centrally operated portable electronic system is proposed to automatically measure coordinate offsets between the trunnions and their support during payload transfer operations. Furthermore, a system is proposed to enhance the electronic counter by calibrating its measurements due to the system mechanical limitations. The calibrating system suggested in this paper is primarily used during the corrections of the reeling range measurements
Keywords :
calibration; counting circuits; cranes; digital instrumentation; distance measurement; ground support equipment; position control; position measurement; space vehicles; Space Shuttle ground support equipment; aerospace payload transfer operations; azimuth range measurement; cargo bay latch; coordinate offsets; correlation coefficient; crane transfer operations; digital counter; electronic calibrating system; electronic counter; elevation range measurement; measurement accuracy; multiple payload transfer operations; multiple payload trunnions; offset distances; quadrature modulation; reeling range measurements; system mechanical limitations; Aerospace electronics; Azimuth; Belts; Conductors; Extraterrestrial measurements; Latches; Mechanical variables measurement; Payloads; Space shuttles; Timing;
Conference_Titel :
National Aerospace and Electronics Conference, 2000. NAECON 2000. Proceedings of the IEEE 2000
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-6262-4
DOI :
10.1109/NAECON.2000.894982