Title :
Error of emission measurement of ICs due to imperfect termination of TEM Cell
Author :
Müllerwiebus, Viki ; Deutschmann, Bernd ; Klotz, Frank
Author_Institution :
Infineon Technol. AG, Neubiberg
Abstract :
Test PCB was used for generalized emission measurement on IC level using GTEM cell. Measurements result show an oscillation which is explained as an influence of imperfect absorbers of GTEM cell. The maximum error due to imperfect absorbers of emission measurement for ICs is regarded and given as a function of the reflection coefficient of absorbers (or terminations of TEM cells in general).
Keywords :
TEM cells; integrated circuit measurement; printed circuit testing; GTEM cell; PCB testing; imperfect absorbers; imperfect termination; integrated circuit emission measurement; maximum error; oscillation; reflection coefficient; Connectors; Current measurement; Frequency measurement; Impedance measurement; Integrated circuit testing; Measurement errors; Performance evaluation; Reflection; TEM cells; Wire; Emission; GTEM; IC; TEM cell; absorber; measurement error; termination;
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location :
Hamburg
Print_ISBN :
978-1-4244-2737-6
Electronic_ISBN :
978-1-4244-2737-6
DOI :
10.1109/EMCEUROPE.2008.4786890
