Title :
Numerical investigation of the induced voltage on a cable placed at random locations inside a metallic enclosure
Author :
Nuño, Luis ; Holloway, Christopher L. ; Wilson, Perry F.
Author_Institution :
Inst. of Inf. Technol. & Adv. Commun. Applic., Polytech. Univ. of Valencia, Valencia
Abstract :
In this paper, we investigate the induced voltage on a cable when placed at random locations inside a metallic enclosure. The analysis consists of a cable of defined length and fixed terminals, but different layouts, placed in a metallic enclosure containing an aperture. The induced voltages for the different layouts are computed for a plane wave incident on the aperture. A second analysis is performed with no cable (i.e., an empty enclosure) and the results are compared to those for the cable present. The results are compared to the resonance frequencies of the closed cavity and the aperture.
Keywords :
cables (electric); electromagnetic compatibility; finite difference time-domain analysis; statistical analysis; cable; finite-difference time-domain method; induced voltage; metallic enclosure; plane incident wave; resonance frequencies; statistical analysis; Apertures; Cables; Finite difference methods; Interference; NIST; Performance analysis; Resonance; Resonant frequency; Time domain analysis; Voltage; finite-difference time-domain (FDTD) method; induced voltage; metallic enclosures; random fields; statistical analysis; susceptibility problems;
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location :
Hamburg
Print_ISBN :
978-1-4244-2737-6
Electronic_ISBN :
978-1-4244-2737-6
DOI :
10.1109/EMCEUROPE.2008.4786891
