Title : 
Analyzing Abnormal Events from Spatio-temporal Trajectories
         
        
            Author : 
Patel, Dhaval ; Bhatt, Chidansh ; Hsu, Wynne ; Lee, Mong Li ; Kankanhalli, Mohan
         
        
            Author_Institution : 
Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
         
        
        
        
        
        
            Abstract : 
Advances in RFID based sensor technologies has been used in applications which requires the tracking of assets, products and individuals. The recording of such movements is captured in a trajectory database and can be analyzed for the monitoring of abnormal events. In this paper, we describe a system called InViTA for analyzing abnormal events from spatio-temporal trajectories captured during an office evacuation after an explosion. InViTA utilizes a trajectory representation scheme and extract the features to derive a set of rules that label each person´s trajectory as belonging to a suspect, witness, or victim, etc. We run the system on the office evacuation data provided in VAST 2008 challenge and obtain comparable results with that obtained from visualization and human analysis. The system includes a user-friendly graphical interface for parameter tuning and intuitive result analysis.
         
        
            Keywords : 
emergency services; feature extraction; graphical user interfaces; human computer interaction; mobile computing; radiofrequency identification; InViTA; RFID based sensor technology; abnormal events; feature extraction; human analysis; intuitive result analysis; office evacuation; parameter tuning; spatio-temporal trajectory; trajectory database; trajectory representation scheme; user-friendly graphical interface; Data mining; Data visualization; Explosions; Feature extraction; Humans; Monitoring; Radiofrequency identification; Spatial databases;
         
        
        
        
            Conference_Titel : 
Data Mining Workshops, 2009. ICDMW '09. IEEE International Conference on
         
        
            Conference_Location : 
Miami, FL
         
        
            Print_ISBN : 
978-1-4244-5384-9
         
        
            Electronic_ISBN : 
978-0-7695-3902-7
         
        
        
            DOI : 
10.1109/ICDMW.2009.45