Title :
Automated near-field scanning to identify resonances
Author :
Muchaidze, G. ; Wei, Huang ; Min, Jin ; Peng, Shao ; Drewniak, Jim ; Pommerenke, David
Author_Institution :
Amber Precision Instrum., Santa Clara, CA
Abstract :
Near-field scanning systems are a tool for root-cause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.
Keywords :
electromagnetic interference; electrostatic discharge; integrated circuits; EMI; ESD; ESD scanning; automated near-field scanning; data exchange; electronic systems; immunity analysis; near-field EMI scanning; qualification methodology; radiated immunity scanning; resonance scanning; Cables; Clocks; Coupling circuits; Electromagnetic compatibility; Electromagnetic interference; Electrostatic discharge; Frequency; Immunity testing; Integrated circuit noise; Resonance; EMI; ESD; Near field scanning; resonance;
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location :
Hamburg
Print_ISBN :
978-1-4244-2737-6
Electronic_ISBN :
978-1-4244-2737-6
DOI :
10.1109/EMCEUROPE.2008.4786897
