DocumentCode :
2774868
Title :
Automated test generation and test point selection for specification test of analog circuits
Author :
Halder, Achintya ; Chatterjee, Abhijit
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2004
fDate :
2004
Firstpage :
401
Lastpage :
406
Abstract :
In this paper, a new automated test generation and concurrent test point selection algorithm for specification based testing of analog circuits is presented. The proposed approach co-optimizes the construction of a multi-tone sinusoidal test stimulus and the selection of the best set of test response observation points. The circuit specifications are predicted accurately from the test response using a prior algorithm. This prediction is based on a statistical regression based mapping of the test response waveform to the specifications of the circuit under test. The test generation and test point selection process tries to maximize the accuracy of specification prediction using the above mapping. Pass/fail test decisions are made using the predicted specifications. Simulation results show excellent performance of the proposed algorithms.
Keywords :
analogue integrated circuits; automatic test pattern generation; conformance testing; integrated circuit testing; regression analysis; a prior algorithm; analog circuit specification test; automated test generation; concurrent test point selection; multitone sinusoidal test stimulus; parametric failure; pass/fail test decisions; specification prediction; statistical regression mapping; test response observation points; Accuracy; Analog circuits; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Manufacturing processes; Observability; Particle measurements; Signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2004. Proceedings. 5th International Symposium on
Print_ISBN :
0-7695-2093-6
Type :
conf
DOI :
10.1109/ISQED.2004.1283707
Filename :
1283707
Link To Document :
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