DocumentCode :
2774899
Title :
Correlation between laser-induced hot-electron cooling and quantum efficiency in THz quantum cascade lasers
Author :
Scamarcio, Gaetano ; Vitiello, M.S. ; Faist, J. ; Scalari, G. ; Walther, Christophe ; Beere, H.E. ; Ritchie, David A.
Author_Institution :
Dipt. Interateneo di Fis. M. Merlin, Univ. degli Studi di Bari, Bari, Italy
fYear :
2009
fDate :
14-19 June 2009
Firstpage :
1
Lastpage :
1
Abstract :
The authors will present an experimental study of the correlation of the electronic temperature of the active region with the stimulated emission of photons in QCLs. Using micro-probe photoluminescence (PL) the authors report the evidence of a new physical phenomenon characteristic of semiconductor lasers, i.e. the cooling of the electrons above the laser threshold for stimulated emission. This effect is directly related with the quantum efficiency, which is one of the central physical quantities in the theory of semiconductor lasers. As a model system we have selected the terahertz quantum cascade laser, in which hot-electron effects must be fully understood to explore the device physical limits in terms of maximum temperature, wavelength and quantum efficiencies.
Keywords :
laser beam effects; photoluminescence; quantum cascade lasers; semiconductor lasers; stimulated emission; THz quantum cascade lasers; electronic temperature; laser induced hot electron cooling; microprobe photoluminescence; quantum efficiency; semiconductor lasers; stimulated emission; Electron emission; Electronics cooling; Laser modes; Laser theory; Photoluminescence; Quantum cascade lasers; Quantum mechanics; Semiconductor lasers; Stimulated emission; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
Type :
conf
DOI :
10.1109/CLEOE-EQEC.2009.5191520
Filename :
5191520
Link To Document :
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