• DocumentCode
    2774899
  • Title

    Correlation between laser-induced hot-electron cooling and quantum efficiency in THz quantum cascade lasers

  • Author

    Scamarcio, Gaetano ; Vitiello, M.S. ; Faist, J. ; Scalari, G. ; Walther, Christophe ; Beere, H.E. ; Ritchie, David A.

  • Author_Institution
    Dipt. Interateneo di Fis. M. Merlin, Univ. degli Studi di Bari, Bari, Italy
  • fYear
    2009
  • fDate
    14-19 June 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The authors will present an experimental study of the correlation of the electronic temperature of the active region with the stimulated emission of photons in QCLs. Using micro-probe photoluminescence (PL) the authors report the evidence of a new physical phenomenon characteristic of semiconductor lasers, i.e. the cooling of the electrons above the laser threshold for stimulated emission. This effect is directly related with the quantum efficiency, which is one of the central physical quantities in the theory of semiconductor lasers. As a model system we have selected the terahertz quantum cascade laser, in which hot-electron effects must be fully understood to explore the device physical limits in terms of maximum temperature, wavelength and quantum efficiencies.
  • Keywords
    laser beam effects; photoluminescence; quantum cascade lasers; semiconductor lasers; stimulated emission; THz quantum cascade lasers; electronic temperature; laser induced hot electron cooling; microprobe photoluminescence; quantum efficiency; semiconductor lasers; stimulated emission; Electron emission; Electronics cooling; Laser modes; Laser theory; Photoluminescence; Quantum cascade lasers; Quantum mechanics; Semiconductor lasers; Stimulated emission; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-4079-5
  • Electronic_ISBN
    978-1-4244-4080-1
  • Type

    conf

  • DOI
    10.1109/CLEOE-EQEC.2009.5191520
  • Filename
    5191520