DocumentCode
2774981
Title
Scaleable equivalent circuit modelling of the E-field coupling to microstrips in the TEM cell
Author
Vanhee, Filip ; Catrysse, Johan ; Gillon, Renaud ; Gielen, Georges
Author_Institution
Dept. of Ind. Sci. & Technol., Katholieke Hogeschool Brugge Oostende, Ostend
fYear
2008
fDate
8-12 Sept. 2008
Firstpage
1
Lastpage
6
Abstract
This investigation focuses on setting up a discrete model of the coupling between a TEM field generated inside a TEM cell to a device under test for use in a circuit simulator. In first instance, different microstrips are used as device under test because of their well-defined characteristics. The resulting models of the TEM cell, the microstrips and the electric field coupling between them are explained. Comparison and validation by measurements is presented for all models.
Keywords
TEM cells; equivalent circuits; microstrip circuits; E-field coupling; TEM cell; circuit simulator; device under test; microstrips; scaleable equivalent circuit modelling; Capacitance; Circuit simulation; Circuit testing; Coupling circuits; Equivalent circuits; Frequency; IEC standards; Immunity testing; Microstrip; TEM cells; TEM cell; coupling capacitance; microstrips; modelling;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location
Hamburg
Print_ISBN
978-1-4244-2737-6
Electronic_ISBN
978-1-4244-2737-6
Type
conf
DOI
10.1109/EMCEUROPE.2008.4786908
Filename
4786908
Link To Document