DocumentCode
2775040
Title
High power ultra wide band and vircator source-victim experiments
Author
Åberg, Denny ; Olsson, Fredrik ; Jansson, Mats ; Lindskog, Claes
Author_Institution
BAE Syst. Bofors AB, Karlskoga
fYear
2008
fDate
8-12 Sept. 2008
Firstpage
1
Lastpage
5
Abstract
This paper presents effects of high power microwave sources on packaged IC circuits. The sources were one UWB system and one narrow band system consisting of a vircator. The paper reports threshold of susceptibilities for the two different sources on victims which were elementary logic circuits of bipolar and MOS-technologies.
Keywords
MIS devices; integrated circuit packaging; logic circuits; ultra wideband technology; vircators; MOS-technologies; elementary logic circuits; high power microwave sources; high power ultra wide band; narrow band system; packaged IC circuits; vircator source-victim experiment; Circuit testing; Coupling circuits; Electromagnetic heating; Electromagnetic interference; Electrostatic discharge; Narrowband; Protection; Temperature; Ultra wideband technology; Voltage; high power microwave; susceptibility; ultra wide band; vircator;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location
Hamburg
Print_ISBN
978-1-4244-2737-6
Electronic_ISBN
978-1-4244-2737-6
Type
conf
DOI
10.1109/EMCEUROPE.2008.4786910
Filename
4786910
Link To Document