Title :
High power ultra wide band and vircator source-victim experiments
Author :
Åberg, Denny ; Olsson, Fredrik ; Jansson, Mats ; Lindskog, Claes
Author_Institution :
BAE Syst. Bofors AB, Karlskoga
Abstract :
This paper presents effects of high power microwave sources on packaged IC circuits. The sources were one UWB system and one narrow band system consisting of a vircator. The paper reports threshold of susceptibilities for the two different sources on victims which were elementary logic circuits of bipolar and MOS-technologies.
Keywords :
MIS devices; integrated circuit packaging; logic circuits; ultra wideband technology; vircators; MOS-technologies; elementary logic circuits; high power microwave sources; high power ultra wide band; narrow band system; packaged IC circuits; vircator source-victim experiment; Circuit testing; Coupling circuits; Electromagnetic heating; Electromagnetic interference; Electrostatic discharge; Narrowband; Protection; Temperature; Ultra wideband technology; Voltage; high power microwave; susceptibility; ultra wide band; vircator;
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location :
Hamburg
Print_ISBN :
978-1-4244-2737-6
Electronic_ISBN :
978-1-4244-2737-6
DOI :
10.1109/EMCEUROPE.2008.4786910
