Evaluation of the disturbing potential of IEMI using mathematical norms and analytical calculations

Author

Korte, Sven ; Garbe, Heyno

Author_Institution

Inst. of the Basics of Electr. Eng. & Meas. Sci., Leibniz Univ. Hannover, Hannover

fYear

2008

fDate

8-12 Sept. 2008

Firstpage

1

Lastpage

6

Abstract

This document shows a new method for estimating the perturbation thresholds of electronic circuits while exposed by an electromagnetic field. The method is based on a simplified calculation of the coupled-in waveforms. It is compared to a former proposed estimation approach based on mathematical norms. Both investigated techniques are compared to measurements of real electronic systems.

Keywords

circuit noise; electromagnetic interference; standards; IEMI; Intentional Electromagnetic Interference; coupled-in waveforms; disturbing potential; electromagnetic field; electronic circuits; mathematical norms; perturbation threshold estimation; Coupling circuits; Electric breakdown; Electromagnetic analysis; Electromagnetic fields; Electromagnetic measurements; Electronic circuits; Pulse measurements; Shape measurement; Transfer functions; Voltage; IEMI; breakdown; coupling; electronic; intentional; transient;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on

Conference_Location

Hamburg

Print_ISBN

978-1-4244-2737-6

Electronic_ISBN

978-1-4244-2737-6

Type

conf

DOI

10.1109/EMCEUROPE.2008.4786915

Filename

4786915