Title :
IEE Colloquium on `Intelligent Fault Diagnosis - Part 1: Classification-Based Techniques´ (Digest No.045)
Abstract :
The following topics were dealt with: automatic test equipment diagnosis; expert system for tool wear monitoring; fault testing hypotheses; object-oriented ES for industrial hardware diagnosis; model-based diagnosis; Amethyst; and condition monitoring; of machine tools
Keywords :
CAD/CAM; automatic test equipment; computerised monitoring; expert systems; failure analysis; machine tools; Amethyst; automatic test equipment diagnosis; condition monitoring; expert system; fault testing hypotheses; industrial hardware diagnosis; machine tools; model-based diagnosis; object-oriented ES; tool wear monitoring;
Conference_Titel :
Intelligent Fault Diagnosis - Part 1: Classification-Based Techniques, IEE Colloquium on
Conference_Location :
London
