مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2775493

Title :

Visual inspection automation

Author :

Jarvis, John F.

Author_Institution :

Bell Laboratories

fYear :

1979

fDate :

1979

Firstpage :

251

Lastpage :

255

Keywords :

Assembly; Contacts; Costs; Hardware; Image analysis; Image processing; Image sensors; Inspection; Manufacturing automation; Pattern recognition;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Computer Software and Applications Conference, 1979. Proceedings. COMPSAC 79. The IEEE Computer Society's Third International

Type :

conf

DOI :

10.1109/CMPSAC.1979.762499

Filename :

762499

Link To Document :