Title :
Sensitivity analysis of the two-thickness and two-layer methods for material parameter extraction using a single waveguide probe
Author :
Dester, Gary D. ; Rothwell, Edward J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI
Abstract :
A full-wave solution for material parameter extraction which uses two independent measurements is presented. When the addition of random noise on the measurements is considered, the estimates of the propagation of those errors greatly reduces the confidence in the two-layer results. Future work shall investigate the two-layer method using different thicknesses and types of material for the top layer.
Keywords :
magnetic field integral equations; magnetic materials; magnetic permeability measurement; permittivity; permittivity measurement; conductor-backed material; error analysis; magnetic field integral equation; material parameter extraction; open flange; open-ended waveguide probe; permittivity; random noise; root finding method; sensitivity analysis; single waveguide probe; two-layer methods; two-thickness methods; Conducting materials; Electromagnetic waveguides; Geometry; Magnetic field measurement; Magnetic materials; Parameter extraction; Probes; Reflection; Sensitivity analysis; Thickness measurement;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2041-4
Electronic_ISBN :
978-1-4244-2042-1
DOI :
10.1109/APS.2008.4619792
