DocumentCode
2775734
Title
Robust defect segmentation in woven fabrics
Author
Sari-Sarraf, Hamed ; Goddard, James S., Jr.
Author_Institution
Oak Ridge Nat. Lab., TN, USA
fYear
1998
fDate
23-25 Jun 1998
Firstpage
938
Lastpage
944
Abstract
This paper describes a robust segmentation algorithm for the detection and localization of woven fabric defects. The essence of the presented segmentation algorithm is the localization of those events (i.e., defects) in the input images that disrupt the global homogeneity of the background texture. To this end, preprocessing modules, based on the wavelet transform and edge fusion, are employed with the objective of attenuating the background texture and accentuating the defects. Then, texture features are utilized to measure the global homogeneity of the output images. If these images are deemed to be globally nonhomogeneous (i.e., defects are present), a local roughness measure is used to localize the defects. The utility of this algorithm can be extended beyond the specific application in our work, that is, defect segmentation in woven fabrics. Indeed, in a general sense, this algorithm can be used to detect and to localize anomalies that reside in images characterized by ordered texture. The efficacy of this algorithm has been tested thoroughly under realistic conditions and as a part of an on-line fabric inspection system. Using over 3700 images of fabrics, containing 26 different types of defects, the overall detection rate of our approach was 89% with a localization accuracy of less than 0.2 inches and a false alarm rate of 2.5%
Keywords
image segmentation; inspection; wavelet transforms; background texture; edge fusion; global homogeneity; input images; local roughness measure; preprocessing modules; robust defect segmentation; wavelet transform; woven fabrics; Fabrics; Image edge detection; Image segmentation; Inspection; Optical sensors; Production; Real time systems; Robustness; Textile industry; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 1998. Proceedings. 1998 IEEE Computer Society Conference on
Conference_Location
Santa Barbara, CA
ISSN
1063-6919
Print_ISBN
0-8186-8497-6
Type
conf
DOI
10.1109/CVPR.1998.698717
Filename
698717
Link To Document