DocumentCode
2775757
Title
De-embedding of lumped-element characteristics with the aid of EM analysis
Author
Hirano, T. ; Hirokawa, J. ; Ando, M. ; Nakano, H. ; Hirachi, Y.
Author_Institution
Tokyo Inst. of Technol., Tokyo
fYear
2008
fDate
5-11 July 2008
Firstpage
1
Lastpage
4
Abstract
We have proposed de-embedding method with the aid of EM analysis. A hybrid S/Z-parameters are used for a four-port parasitic circuit. The higher accuracy of the proposed method, within 4%, is validated via EM simulation than that of conventional method using open/short-TEG, more than 10%. Verification of the proposed method by experiment is the future task.
Keywords
computational electromagnetics; EM analysis; TEG; four-port parasitic circuit; hybrid S-Z parameters; lumped-element characteristics; Admittance measurement; Circuit simulation; Circuit testing; FETs; Impedance; Integrated circuit interconnections; Integrated circuit technology; Parameter extraction; Scattering parameters; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
Conference_Location
San Diego, CA
Print_ISBN
978-1-4244-2041-4
Electronic_ISBN
978-1-4244-2042-1
Type
conf
DOI
10.1109/APS.2008.4619795
Filename
4619795
Link To Document