• DocumentCode
    2775801
  • Title

    Mining Fine Grained Opinions by Using Probabilistic Models and Domain Knowledge

  • Author

    Miao, Qingliang ; Li, Qiudan ; Zeng, Daniel

  • Author_Institution
    Inst. of Autom., Chinese Acad. of Sci., Beijing, China
  • Volume
    1
  • fYear
    2010
  • fDate
    Aug. 31 2010-Sept. 3 2010
  • Firstpage
    358
  • Lastpage
    365
  • Abstract
    The explosive growth of the user-generated content on the Web has offered a rich data source for mining opinions. However, the large number of diverse review sources challenges the individual users and organizations on how to use the opinion information effectively. Therefore, automated opinion mining and summarization techniques have become increasingly important. Different from previous approaches that have mostly treated product feature and opinion extraction as two independent tasks, we merge them together in a unified process by using probabilistic models. Specifically, we treat the problem of product feature and opinion extraction as a sequence labeling task and adopt Conditional Random Fields models to accomplish it. As part of our work, we develop a computational approach to construct domain specific sentiment lexicon by combining semi-structured reviews with general sentiment lexicon, which helps to identify the sentiment orientations of opinions. Experimental results on two real world datasets show that the proposed method is effective.
  • Keywords
    Internet; content-based retrieval; data mining; feature extraction; information retrieval; Web content; automated opinion mining; conditional random field model; domain knowledge; domain specific sentiment lexicon; fine grained opinion mining; opinion extraction; probabilistic model; product feature extraction; semistructured review; sequence labeling task; user-generated content; Conditional Random Fields; Domain Knowledge; Fine-grained Opinon Mining;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Web Intelligence and Intelligent Agent Technology (WI-IAT), 2010 IEEE/WIC/ACM International Conference on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-8482-9
  • Electronic_ISBN
    978-0-7695-4191-4
  • Type

    conf

  • DOI
    10.1109/WI-IAT.2010.193
  • Filename
    5616605