• DocumentCode
    2775851
  • Title

    Ultraclean Technology for ULSI Scientific Manufacturing

  • Author

    Ohmi, Tadahiro

  • Author_Institution
    Tohoku University
  • fYear
    1993
  • fDate
    20-21 Sept. 1993
  • Keywords
    Annealing; CMOS technology; Copper; Epitaxial growth; Manufacturing; Oxidation; Silicon; Surface resistance; Temperature; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 1993. International Symposium on
  • Conference_Location
    Austin, TX, USA
  • Type

    conf

  • DOI
    10.1109/ISSM.1993.670308
  • Filename
    670308