A compact error model for reliable system design

Author

Israr, Adeel ; Shoufan, Abdulhadi ; Huss, Sorin A.

Author_Institution

Integrated Circuits & Syst. Lab., Tech. Univ. Darmstadt, Darmstadt, Germany

fYear

2009

fDate

21-24 June 2009

Firstpage

60

Lastpage

66

Abstract

Permanent and transient errors are inherently different in property and effect. This paper shows how to utilize this fact to develop a System Error Decision Diagram for reliable embedded systems. Based on this model an efficient approach for reliability evaluation is developed. The model and the reliability evaluation approach are assumed to be employed in a system-level design process to accelerate design space exploration. The proposed approach is demonstrated for a control system taken from the automotive domain.

Keywords

binary decision diagrams; decision support systems; embedded systems; error analysis; fault tolerant computing; hardware-software codesign; design space exploration; embedded system; fault tolerant hardware-software codesign; permanent error; reliability evaluation; system error decision diagram; transient error; Automotive engineering; Binary decision diagrams; Boolean functions; Data structures; Embedded system; Integrated circuit modeling; Integrated circuit reliability; Process design; Scheduling; Space exploration; Fault Tolerant HW/SW Co-Design; Reliability Evaluation; System Error Decision Diagram;

fLanguage

English

Publisher

ieee

Conference_Titel

High Performance Computing & Simulation, 2009. HPCS '09. International Conference on

Conference_Location

Leipzig

Print_ISBN

978-1-4244-4906-4

Electronic_ISBN

978-1-4244-4907-1

Type

conf

DOI

10.1109/HPCSIM.2009.5191574

Filename

5191574