• DocumentCode
    2776140
  • Title

    Influence of co-field and cross field flow of mineral oil with and without additives on conduction current and breakdown voltage in highly nonuniform fields

  • Author

    Megahed, I.Y. ; Zaky, AA ; Abdallah, MA

  • Author_Institution
    Dept. of Electr. Eng., Alexandria Univ., Egypt
  • Volume
    2
  • fYear
    1996
  • fDate
    16-19 Jun 1996
  • Firstpage
    569
  • Abstract
    The paper presents the results of the effect of enforced co-field and cross-field oil flow on the conduction current and breakdown voltage of degassed oil, oil saturated with O2 and with SF6 and oil containing 1-methylnaphthalene (MN) and dimethylaniline (DMA) as additives. Direct voltage and a point-to-plane electrode geometry were used and results were obtained for both polarities of the point electrode. A general conclusion from all experiments is that oil flow, whether co-field or cross-field, raises the breakdown voltage and lowers the conduction current. The results also show that with the exception of DMA, all additives both gaseous (O 2 and SF6) or solid (MN) raised the breakdown voltage and reduced conduction current, compared with degassed oil, for both polarities of the point electrode. These effects are attributed to the electron-trapping properties of the additives
  • Keywords
    SF6 insulation; electric breakdown; electric current measurement; electrodes; oxygen; polymers; transformer oil; voltage measurement; 1-methylnaphthalene additive; O2; SF6; breakdown voltage; co-field oil flow; conduction current; cross field oil flow; degassed oil; dimethylaniline additive; electron-trapping properties; highly nonuniform fields; mineral oil; oil flow; point electrode polarities; point-to-plane electrode geometry; Additives; Breakdown voltage; Current measurement; Electric breakdown; Electrodes; Minerals; Oil insulation; Petroleum; Sulfur hexafluoride; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-3531-7
  • Type

    conf

  • DOI
    10.1109/ELINSL.1996.549409
  • Filename
    549409