• DocumentCode
    277640
  • Title

    SETH: an expert system for functional test and fault diagnosis of electronic devices

  • Author

    Vavassori, R. ; Angeleri, V.

  • fYear
    1992
  • fDate
    19-21 Aug 1992
  • Firstpage
    59
  • Lastpage
    64
  • Abstract
    The authors describe how test benches based on the SETH System are used in Siemens Telecomunicazioni connected one another to form a testing line. During its activity SETH automatically drives the complex set of instruments that forms the test bench. By comparing the actual value read on the unit under test and the values stored in the knowledge base, SETH determines the next action to be executed. The knowledge base of SETH is fully maintainable by the testing experts without the help of the knowledge engineers
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Intelligent Systems Engineering, 1992., First International Conference on (Conf. Publ. No. 360)
  • Conference_Location
    Edinburgh
  • Print_ISBN
    0-85296-549-4
  • Type

    conf

  • Filename
    171918