DocumentCode
277640
Title
SETH: an expert system for functional test and fault diagnosis of electronic devices
Author
Vavassori, R. ; Angeleri, V.
fYear
1992
fDate
19-21 Aug 1992
Firstpage
59
Lastpage
64
Abstract
The authors describe how test benches based on the SETH System are used in Siemens Telecomunicazioni connected one another to form a testing line. During its activity SETH automatically drives the complex set of instruments that forms the test bench. By comparing the actual value read on the unit under test and the values stored in the knowledge base, SETH determines the next action to be executed. The knowledge base of SETH is fully maintainable by the testing experts without the help of the knowledge engineers
fLanguage
English
Publisher
iet
Conference_Titel
Intelligent Systems Engineering, 1992., First International Conference on (Conf. Publ. No. 360)
Conference_Location
Edinburgh
Print_ISBN
0-85296-549-4
Type
conf
Filename
171918
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