Title :
Crude estimates of mutual and active impedences
Author_Institution :
ELTA Electronics Ltd., Ashdod, Israel
Keywords :
Diffraction; Electronics industry; Impedance measurement; Mutual coupling; Parameter estimation; Polynomials; Q measurement; System performance; Voltage;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1984
Conference_Location :
Boston, MA, USA
DOI :
10.1109/APS.1984.1149174
