• DocumentCode
    2776490
  • Title

    High Speed Interface Wirebond Modeling Division Methodology

  • Author

    Beh Jiun Kai ; Chan Kim, Lee

  • Author_Institution
    Intel Microelectron., Penang
  • fYear
    2006
  • fDate
    11-14 Dec. 2006
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    As the frequency of the high speed interfaces in computer platforms and systems continue to ramp due to architectural advancement and strong market demands, electronic packages have been stretched to its limit to support these interfaces. The increase in the complexities caused the electrical modeling methodologies to become increasingly complicated and tedious too. New modeling methodologies have to be developed to shorten through put time without sacrificing much of its accuracy. Wirebond package has been in the industry for a long time due to its good performance and relatively low cost compared to flip chip package. Even though facing huge challenge to support higher frequency interfaces, wirebond package still proves to be a capable and cost effective solution, but at the expense of requiring extensive and tedious modeling work. This paper discusses the high speed interfaces wirebond modeling methodology proposed to improve through put time and scalability besides reducing multiple models extraction required and human errors associated with it. This is done by mathematically dividing the parasitic resistance, inductance and capacitance obtained from a full wirebond model by the number of segments required based on the interface frequency. In order to obtain a 3-dimensional package electrical model, the wirebond models are extracted and analyzed based on their actual physical dimension from a specific package for accurate results using AnsoftLinktrade and Ansoft Q3D Extractorreg. The wirebond models extracted are then connected with other package interconnect models and simulated using HSPICE, Ansoft Designerreg/Nexximreg and Matlabreg are used to obtain its final result in terms of eye diagram, time domain reflectometry (TDR) impedance, insertion and return loss. TDR measurement has been performed on actual package and the results are correlating well with the analysis result, proving the accuracy of this methodology. The proposed modeling methodology shows acc- urate results and significantly reduces through put time, thus it should be considered as an option to model high speed interfaces´ wirebond.
  • Keywords
    SPICE; electronics packaging; interconnections; lead bonding; time-domain reflectometry; Ansoft Designer; Ansoft Q3D Extractor; AnsoftLink; HSPICE; Matlab; Nexxim; electronic packages; eye diagram; high speed interface wirebond modeling division methodology; package interconnect models; three-dimensional package electrical model; time domain reflectometry; wirebond package; Computer interfaces; Consumer electronics; Costs; Electronics packaging; Flip chip; Frequency; Humans; Immune system; Mathematical model; Scalability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
  • Conference_Location
    Kowloon
  • Print_ISBN
    978-1-4244-0834-4
  • Electronic_ISBN
    978-1-4244-0834-4
  • Type

    conf

  • DOI
    10.1109/EMAP.2006.4430579
  • Filename
    4430579