• DocumentCode
    2776587
  • Title

    Two New Space-Time Triple Modular Redundancy Techniques for Improving Fault Tolerance of Computer Systems

  • Author

    Chen, Wei ; Gong, Rui ; Dai, Kui ; Liu, Fang ; Wang, Zhiying

  • Author_Institution
    National University of Defense Technology, China
  • fYear
    2006
  • fDate
    Sept. 2006
  • Firstpage
    175
  • Lastpage
    175
  • Abstract
    Triple Modular Redundancy (TMR) is widely used to improve fault tolerance of computer systems against transient faults. Conventional TMR is effective in protecting sequential circuits but can¿t mask transient faults in combinational circuits. New redundancy techniques called Space-Time TMR (ST-TMR) and Enhanced ST-TMR (EST-TMR) with double edge triggered registers are presented in this paper, which improve fault tolerance of both combinational circuits and sequential circuits. ST-TMR is effective in protecting throughput circuit while EST-TMR is effective in protecting state-machine circuit. This paper demonstrates the usefulness of ST-TMR and EST-TMR in two special case studies. The overhead and fault tolerance of ST-TMR and EST-TMR are compared with that of the conventional TMR. Results show that ST-TMR and EST-TMR are more effective.
  • Keywords
    Circuit faults; Combinational circuits; Electromagnetic transients; Fault tolerance; Fault tolerant systems; Protection; Redundancy; Registers; Sequential circuits; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Technology, 2006. CIT '06. The Sixth IEEE International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    0-7695-2687-X
  • Type

    conf

  • DOI
    10.1109/CIT.2006.189
  • Filename
    4019959