• DocumentCode
    2776683
  • Title

    Analyzing and Extending MUMCUT for Fault-based Testing of General Boolean Expressions

  • Author

    Sun, Chang-ai ; Dong, Yunwei ; Lai, R. ; Sim, K.Y. ; Chen, T.Y.

  • Author_Institution
    Swinburne University of Technology, Australia
  • fYear
    2006
  • fDate
    Sept. 2006
  • Firstpage
    184
  • Lastpage
    184
  • Abstract
    Boolean expressions are widely used to model decisions or conditions of a specification or source program. The MUMCUT, which is designed to detect seven common faults where Boolean expressions under test are assumed to be in Irredundant Disjunctive Normal Form (IDNF), is an efficient fault-based test case selection strategy in terms of the fault-detection capacity and the size of selected test suite. Following up our previous work that reported the fault-detection capacity of the MUMCUT when it is applied to general form Boolean expressions, in this paper we present the characteristic of the types of single faults committed in general Boolean expressions that a MUMCUT test suite fails to detect, analyze the certainty why a MUMCUT test suite fails to detect these types of undetected faults, and provide some extensions to enhance the detection capacity of the MUMCUT for these types of undetected faults.
  • Keywords
    Communications technology; Computer science; Costs; Failure analysis; Fault detection; Genetic mutations; Information technology; Programming profession; Software testing; Terminology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Technology, 2006. CIT '06. The Sixth IEEE International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    0-7695-2687-X
  • Type

    conf

  • DOI
    10.1109/CIT.2006.51
  • Filename
    4019965