Title :
Robustness with respect to SEUs of a self-converging algorithm
Author :
Velazco, R. ; Foucard, G. ; Pancher, Fabrice ; Mansour, Wassim ; Marques-Costa, G. ; Sohier, D. ; Bui, A.
Author_Institution :
Lab. TIMA-UJF, Inst. Nat. Polytechmque, Grenoble, France
Abstract :
Self-convergence is a property of distributed systems, allowing a system, when it was perturbed or badly initialised, to recover a correct operation in a finite number of calculation steps. In this paper is explored the intrinsic robustness of a self converging algorithm with respect to soft errors resulting from SEU (Single Event Upset) phenomena. This study was performed by fault injection using a devoted test platform. A self-converging benchmark program was executed by a LEON3 processor implemented in an FPGA. The low number of observed errors puts in evidence the fault tolerance of the tested algorithm.
Keywords :
fault tolerance; field programmable gate arrays; microprocessor chips; FPGA; LEON3 processor; SEU phenomena; distributed system; fault injection; fault tolerance; intrinsic robustness; self-converging benchmark program; single event upset phenomena; soft error; SEU; Self-stabilization; fault injection; fault tolerance;
Conference_Titel :
Test Workshop (LATW), 2011 12th Latin American
Conference_Location :
Porto de Galinhas
Print_ISBN :
978-1-4577-1489-4
DOI :
10.1109/LATW.2011.5985916