• DocumentCode
    2776815
  • Title

    Using an FPGA-based fault injection technique to evaluate software robustness under SEEs: A case study

  • Author

    Portela-Garcia, M. ; Lindoso, A. ; Entrena, L. ; Garcia-Valderas, M. ; Lopez-Ongil, C. ; Pianta, Bernardo ; Poehls, Leticia B. ; Vargas, Fabin

  • Author_Institution
    Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain
  • fYear
    2011
  • fDate
    27-30 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Microprocessor-based system´s robustness under Single Event Effects is a very current concern. A widely adopted solution to make robust a microprocessor-based system consists in modifying the software application by adding redundancy and fault detection capabilities. The efficiency of the selected software-based solution must be assessed. This evaluation process allows the designers to choose the more suitable robustness technique and check if the hardened system achieves the expected dependability levels. Several approaches with this purpose can be found in the literature, but their efficiency is limited in terms of the number of faults that can be injected, as well as the level of accuracy of the fault injection process. In this paper, we propose FPGA-based fault injection techniques to evaluate software robustness methods under Single Event Upset (SEU) as well as Single Event Transient (SET). Experimental results illustrate the benefits of using the proposed fault injection method, which is able to evaluate a high amount of faults of both types of events.
  • Keywords
    fault diagnosis; field programmable gate arrays; microprocessor chips; redundancy; software performance evaluation; FPGA-based fault injection technique; SEE; SET; SEU; dependability levels; fault detection capability; microprocessor-based system robustness; redundancy; single event transient; single event upset; software robustness evaluation; Circuit faults; Dictionaries; Optimization; Pipelines; Robustness; Single event upset; Software; Embedded Software Design; Fault injection; SET; SEU;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Workshop (LATW), 2011 12th Latin American
  • Conference_Location
    Porto de Galinhas
  • Print_ISBN
    978-1-4577-1489-4
  • Type

    conf

  • DOI
    10.1109/LATW.2011.5985918
  • Filename
    5985918