DocumentCode
2776956
Title
Mutation analysis for SystemC designs at TLM
Author
Guarnieri, Valerio ; Bombieri, Nicola ; Pravadelli, Graziano ; Fummi, Franco ; Hantson, Hanno ; Raik, Jaan ; Jenihhin, Maksim ; Ubar, Raimund
Author_Institution
Dept. of Comput. Sci., Univ. of Verona, Verona, Italy
fYear
2011
fDate
27-30 March 2011
Firstpage
1
Lastpage
6
Abstract
Mutation analysis has been borrowed from the software testing domain as a technique for evaluating the quality of testbenches in validating digital systems. This paper presents a new method for applying mutation analysis on SystemC hardware designs at Transaction-Level Modeling (TLM). The method injects mutants by directly perturbing the SystemC code. Five key categories of mutation operators are implemented in order to speed up the analysis process. In the paper, a comparison of mutation analysis at two different abstraction levels - TLM and Register-Transfer Level (RTL), is carried out. The experiments show that mutation analysis is considerably faster at TLM than it is at RTL while achieving almost equal mutant coverage. Last but not least, TLM mutation analysis provides also more readable feedback for the engineer to improve the testbench. To the best of our knowledge this is the first method for mutation analysis directly working on uncompiled SystemC TLM code.
Keywords
program testing; software performance evaluation; software quality; SystemC hardware designs; TLM; digital system validation; mutation analysis; mutation operators; mutation testing; software testing; testbench quality evaluation; transaction-level modeling; uncompiled SystemC TLM code; Analytical models; Encoding; Hardware; Testing; Time domain analysis; Time varying systems; Timing; RTL; SystemC; TLM; mutation analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop (LATW), 2011 12th Latin American
Conference_Location
Porto de Galinhas
Print_ISBN
978-1-4577-1489-4
Type
conf
DOI
10.1109/LATW.2011.5985925
Filename
5985925
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