Title :
Failure Reporting, Analysis And Corrective Action System In The US Semiconductor Manufacturing Equipment Industry: A Continuous Improvement Process
Author :
Villacourt, Mario
Author_Institution :
SEMATECH
Keywords :
Aerospace industry; Defense industry; Failure analysis; Flowcharts; Life testing; Manufacturing industries; Reliability engineering; Semiconductor device manufacture; Semiconductor device reliability; Semiconductor device testing;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
Print_ISBN :
0-7803-0755-0
DOI :
10.1109/IEMT.1992.639872