DocumentCode
2777300
Title
Analysis of electromagnetic field penetration through apertures based on electromagnetic topology
Author
Park, Yoon-Mi ; Lee, Younju ; Chung, Young-Seek ; Cheon, Changyul ; Jung, Hyun-Kyo
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul
fYear
2008
fDate
5-11 July 2008
Firstpage
1
Lastpage
4
Abstract
In this paper, a method for computation of electromagnetic field penetration is proposed. A cavity model with an aperture was analyzed using electromagnetic topology (EMT) based on Baum-Liu-Tesche (BLT) equation. The rectangular cavity Greendasias function is used to determine the fields in the cavity and the free space Greendasias function is used to determine the scattered fields due to the aperture in the free space. The equations are substituted in the BLT equation and determine electromagnetic field penetration. The results from topological modeling are in agreement with simulation results. In this research, field coupling phenomenon between external fields and a wire in the cavity is studied, thus further research is required relating EMC analysis to the integrated circuit in the cavity using EMT.
Keywords
Green´s function methods; computational electromagnetics; electromagnetic compatibility; electromagnetic interference; electromagnetic wave scattering; Baum-Liu-Tesche equation; EMC analysis; cavity model; electromagnetic compatibility; electromagnetic field penetration computation; electromagnetic interference; electromagnetic topology; field coupling phenomenon; finite difference time domain method; free space Green function; rectangular cavity Green function; scattered fields; topological modeling; Apertures; Circuit simulation; Coupling circuits; Electromagnetic analysis; Electromagnetic fields; Electromagnetic modeling; Electromagnetic scattering; Equations; Topology; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
Conference_Location
San Diego, CA
Print_ISBN
978-1-4244-2041-4
Electronic_ISBN
978-1-4244-2042-1
Type
conf
DOI
10.1109/APS.2008.4619877
Filename
4619877
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