DocumentCode :
2777300
Title :
Analysis of electromagnetic field penetration through apertures based on electromagnetic topology
Author :
Park, Yoon-Mi ; Lee, Younju ; Chung, Young-Seek ; Cheon, Changyul ; Jung, Hyun-Kyo
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul
fYear :
2008
fDate :
5-11 July 2008
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, a method for computation of electromagnetic field penetration is proposed. A cavity model with an aperture was analyzed using electromagnetic topology (EMT) based on Baum-Liu-Tesche (BLT) equation. The rectangular cavity Greendasias function is used to determine the fields in the cavity and the free space Greendasias function is used to determine the scattered fields due to the aperture in the free space. The equations are substituted in the BLT equation and determine electromagnetic field penetration. The results from topological modeling are in agreement with simulation results. In this research, field coupling phenomenon between external fields and a wire in the cavity is studied, thus further research is required relating EMC analysis to the integrated circuit in the cavity using EMT.
Keywords :
Green´s function methods; computational electromagnetics; electromagnetic compatibility; electromagnetic interference; electromagnetic wave scattering; Baum-Liu-Tesche equation; EMC analysis; cavity model; electromagnetic compatibility; electromagnetic field penetration computation; electromagnetic interference; electromagnetic topology; field coupling phenomenon; finite difference time domain method; free space Green function; rectangular cavity Green function; scattered fields; topological modeling; Apertures; Circuit simulation; Coupling circuits; Electromagnetic analysis; Electromagnetic fields; Electromagnetic modeling; Electromagnetic scattering; Equations; Topology; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2041-4
Electronic_ISBN :
978-1-4244-2042-1
Type :
conf
DOI :
10.1109/APS.2008.4619877
Filename :
4619877
Link To Document :
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