DocumentCode
2777487
Title
On the simultaneous construction of sample paths
Author
Yucesan, Enver ; Jacobson, Sheldon H.
Author_Institution
Technol. Manage. Area, INSEAD, Fontainebleau, France
fYear
1995
fDate
3-6 Dec 1995
Firstpage
357
Lastpage
361
Abstract
Sensitivity analysis and optimization within stochastic discrete event simulation require the ability to rapidly estimate performance measures under different parameter values. One technique, termed “rapid learning”, aims at enumerating all possible sample paths under different parameter values of the model based on the observed sample path under the nominal parameter value. There are two necessary conditions for this capability: observability, which asserts that every state observed in the nominal path is always richer in terms of feasible events than the states observed in the constructed paths, and constructability, which, in addition to observability, requires that the lifetime of an event has the same distribution as its residual life. This paper asserts that the verification of the observability condition is an NP-hard search problem. This result, in turn, implies that it is algorithmically not possible to find parameter values satisfying observability; hence, it encourages the development of heuristic procedures. Further implications are also discussed
Keywords
computational complexity; discrete event simulation; heuristic programming; learning (artificial intelligence); observability; optimisation; search problems; sensitivity analysis; software performance evaluation; stochastic processes; NP-hard search problem; constructability; event lifetime distribution; feasible events; heuristic procedures; necessary conditions; observability; optimization; parameter values; performance measure estimation; rapid learning; residual life; sensitivity analysis; simultaneous sample paths construction; stochastic discrete event simulation; Analytical models; Discrete event simulation; Frequency measurement; Jacobian matrices; Observability; Search problems; Sensitivity analysis; Statistical analysis; Stochastic processes; Technology management;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference Proceedings, 1995. Winter
Conference_Location
Arlington, VA
Print_ISBN
0-78033018-8
Type
conf
DOI
10.1109/WSC.1995.478758
Filename
478758
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