Title :
Spectral features for the classification of partial discharge signals from selected insulation defect models
Author :
Ambikairajah, Raji ; Bao Toan Phung ; Ravishankar, Jayashri ; Blackburn, Trevor
Author_Institution :
Sch. of Electr. Eng. & Telecommun., Univ. of New South Wales, Sydney, NSW, Australia
Abstract :
Time-domain features of partial discharge (PD) signals are often used to classify PD patterns. This paper proposes spectral features that are extracted using a filter bank, consisting of band-pass filters. By applying the fast Fourier transform to the PD signal, the resulting frequency bins are grouped into L octave frequency sub-bands. Two new features called the octave frequency moment coefficients (OFMC) and octave frequency Cepstral coefficients (OFCC) are defined in this paper. In addition, time-frequency domain coefficients (TFDC) obtained via wavelet analysis are also analysed. A PD signal can now be represented as an L-dimensional feature vector of OFMC, OFCC or TFDC. These features are compared with discrete wavelet transform-based higher-order statistical features (HOSF) using three different classifiers: probabilistic neural network, support vector machine and the recently emerged sparse representation classifier. Results show that the proposed spectral features are robust and provide a better classification accuracy of PD signals, compared with HOSF.
Keywords :
band-pass filters; channel bank filters; feature extraction; higher order statistics; neural nets; partial discharges; probability; signal classification; signal representation; support vector machines; time-frequency analysis; wavelet transforms; HOSF; L octave frequency sub-bands; L-dimensional feature vector; OFCC; OFMC; PD signal; TFDC; band-pass filters; discrete wavelet transform-based higher-order statistical features; fast Fourier transform; features extraction; filter bank; frequency moment coefficients; octave frequency Cepstral coefficients; partial discharge signal classification; probabilistic neural network; selected insulation defect models; sparse representation classifier; spectral features; support vector machine; time-frequency domain coefficients; wavelet analysis;
Journal_Title :
Science, Measurement & Technology, IET
DOI :
10.1049/iet-smt.2012.0024