DocumentCode
2777827
Title
Optimization of spray coating photoresist for high topography surfaces
Author
Lee, Yong Yeow ; Yu, Liming ; Tay, Ftancis E H ; Iliescu, Ciprian
Author_Institution
Inst. of Bioeng. & Nanotechnol., Singapore
Volume
1
fYear
2005
fDate
3-5 Oct. 2005
Firstpage
171
Abstract
In this paper, we present a practical optimization approach for photoresist mix and a reliable method to qualify the photoresist coated, not only on the planar surface, but also at the edges and side of slopes within the trenches. By observing the cross sectional profile of the trenches, the spray coater machine and photoresist compositions are optimized to produce a desirable cross-sectional profile, especially for sidewall. Information regarding the uniformity of the photoresist coated along the sidewalls and limitations of the proposed technique are discussed. After optimization, good coverage and uniformity of photoresist are achieved not only on planar surface, but also in sidewall of trenches.
Keywords
photoresists; spray coatings; surface topography; cross-sectional profile; photoresist; planar surface; spray coater machine; spray coating; topography surfaces; trenches; Coatings; Glass; Gravity; Microelectromechanical devices; Nanotechnology; Optimization methods; Resists; Solvents; Spraying; Surface topography;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 2005. CAS 2005 Proceedings. 2005 International
Print_ISBN
0-7803-9214-0
Type
conf
DOI
10.1109/SMICND.2005.1558739
Filename
1558739
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