• DocumentCode
    2777858
  • Title

    Evaluation of Interface Crack between Solder Ball and Copper Based on the Non-Destructive Monitoring of Direct Current Potential Difference

  • Author

    Tada, Naoya ; Andou, Takahiro

  • Author_Institution
    Okayama Univ., Okayama
  • fYear
    2006
  • fDate
    11-14 Dec. 2006
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    An evaluation method of interface crack between solder ball and copper based on the non-destructive monitoring of direct current potential difference was proposed. The validity of the method was examined based on the results of electric field analysis by the finite element method. In the analysis, it was assumed that a solder ball was simply joined on the surface of a copper plate and the interface crack was evaluated by the potential difference between the top of the wire inserted into the solder ball and the copper plate. It was found from the analysis that the relationship between the crack area ratio and the increase in the potential difference was given by a single formula for all the conditions assumed in this study. As an experimental verification, a cyclic tensile test was carried out for the interface between Sn-3Ag-0.5Cu lead-free solder balls and a plate specimen of pure copper. Similar relationship between the crack area ratio and the increase in the potential difference held for the test. This suggests that the proposed method is applicable to the evaluation of actual interface cracks initiated in the specimens or in various electric packages.
  • Keywords
    copper compounds; crack detection; electric fields; finite element analysis; nondestructive testing; reliability; silver compounds; solders; tensile testing; tin compounds; SnAgCu; copper plate; cyclic tensile testing; direct current potential difference; electric field analysis; electric packages; finite element method; interface crack evaluation; nondestructive monitoring; reliability testing; solder ball; Copper; Electronic waste; Environmentally friendly manufacturing techniques; Finite element methods; Inorganic materials; Lead; Monitoring; Temperature; Testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
  • Conference_Location
    Kowloon
  • Print_ISBN
    978-1-4244-0834-4
  • Electronic_ISBN
    978-1-4244-0834-4
  • Type

    conf

  • DOI
    10.1109/EMAP.2006.4430649
  • Filename
    4430649