Noise considerations in the design of potentially unstable microwave transistor amplifiers in the CCITL system

The noise considerations for a design of potentially unstable microwave transistor amplifier integrated with CCITLs are investigated. The bilinear transformation, with a verification using the CC approach, is employed to map graphical solutions from the Z₀ system into the CCITL system. The magnitude of F_i decreases rapidly with G_A, especially for larger phi, and more slowly as G_A approaches MSG for every argument phi. In addition, it increases with the argument phi for every G_A in the range of interest implying that smaller noise figures can be achieved at smaller phi values for this test transistor. A rapid increase of (VSWR)_in values is observed as G_A approaches MSG. This result indicates trade-offs between G_A and the input VSWR to obtain the optimal performance in this test amplifier design in the CCITL system.