Title :
Frequency Domain Based Topology Optimization for DRR2-533 DRAM Interface in SFF Domain
Author :
Lakshman, L. ; Ramaswamy, Parthasarathy ; Ryu, Woong Hwan
Author_Institution :
Intel Technol. India Pvt Ltd, Bangalore
Abstract :
This paper discusses signal integrity (SI) challenges in interfacing Intelreg 945 GMS graphics and memory controller hub (GMCH) with DDR2-533 memory (both SO-DIMM and on board memory for SFF (small form factor) designs. SFF designs are constrained by power and space. This paper outlines SI analysis through frequency domain (FD) methodology and correlates with time domain (TD) results. This paper could serve as a guideline with theoretical and implementation details for platform architects and designers. Also it provides the strategic planning and marketing people with an insight on the rising SI challenges faced in interface of high speed and high density memories in SFF designs.
Keywords :
DRAM chips; computer interfaces; frequency-domain analysis; logic design; DRR2-533 DRAM interface; SFF designs; SFF domain; Small Form Factor designs; frequency domain based topology optimization; graphics- and -memory controller hub; high density memories; high speed memories; on board memory; signal integrity analysis; Bandwidth; Frequency domain analysis; Impedance; Intersymbol interference; Random access memory; Resonance; Signal design; Time domain analysis; Timing; Topology;
Conference_Titel :
Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
Conference_Location :
Kowloon
Print_ISBN :
978-1-4244-0834-4
Electronic_ISBN :
978-1-4244-0834-4
DOI :
10.1109/EMAP.2006.4430674