• DocumentCode
    277836
  • Title

    Improved fabrication technologies for GaAs power MMICs

  • Author

    Jessup, M. ; Davies, I. ; Bestwick, P.R. ; Vanner, K.C.

  • Author_Institution
    Plessey Res. Caswell Ltd., Towcester, UK
  • fYear
    1991
  • fDate
    33253
  • Firstpage
    42430
  • Lastpage
    42433
  • Abstract
    Describes the technology enhancements necessary to produce GaAs IC chips that combine small signal and power functions on a single chip. The well established small signal production MMIC process has a final substrate thickness of 200 μm and the active layers are prepared by ion implantation into semi-insulating GaAs substrates, both these aspects must be retained when fabricating power MMICs in order to maintain a high yield commercially compatible process. The realisation of power MMIC structures under these two main constraints has required the development of a new material doping specification and a novel heatsink structure
  • Keywords
    III-V semiconductors; MMIC; gallium arsenide; integrated circuit technology; ion implantation; power integrated circuits; 200 micron; GaAs; active layers; fabrication technologies; heatsink structure; ion implantation; material doping specification; power MMICs; power functions; semi-insulating substrates; small signal production; technology enhancements; yield;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Integrated Power Devices, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    180812