• DocumentCode
    2778386
  • Title

    An Approach to Regression Test Selection Based on Hierarchical Slicing Technique

  • Author

    Tao, Chuanqi ; Li, Bixin ; Sun, Xiaobing ; Zhang, Chongfeng

  • Author_Institution
    Sch. of Comput. Sci. & Eng., Southeast Univ., Nanjing, China
  • fYear
    2010
  • fDate
    19-23 July 2010
  • Firstpage
    347
  • Lastpage
    352
  • Abstract
    Regression testing is an important stage of software maintenance. Regression test selection is a key technique to test case reuse. Program slicing is one of these commonly used regression test selection techniques. The proposed slicing techniques for regression test selection are primarily for procedural program. Hierarchy slice, which is used for object-oriented programs according to the logical hierarchy of program, is able to compute slice step by step based on hierarchical slicing criterion. Compared to traditional slicing, hierarchical slicing technique can produce more precise slice especially for object-oriented program. This paper applies hierarchical slicing technique to regression test selection in order to improve the precision of regression test selection and address the problem of level. The approach computes hierarchy slice on the modified parts of program, then selects test cases from different levels in terms of test case coverage. This approach can select test cases from high level to low level of program. The initial experimental results present the effectiveness of applying hierarchical slicing in regression test selection.
  • Keywords
    object-oriented programming; program slicing; program testing; software maintenance; software reusability; hierarchical slicing technique; logical hierarchy; object-oriented programs; procedural program; program slicing; regression test selection; software maintenance; software reuse; hierarchical slicing; regression test selection; regression testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Software and Applications Conference Workshops (COMPSACW), 2010 IEEE 34th Annual
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-8089-0
  • Electronic_ISBN
    978-0-7695-4105-1
  • Type

    conf

  • DOI
    10.1109/COMPSACW.2010.67
  • Filename
    5616737