DocumentCode :
2778500
Title :
Experimental evaluation of fast random bit sequence generation using chaotic semiconductor lasers
Author :
Uchida, Atsushi ; Hirano, Kunihito ; Amano, Kazuya ; Inoue, Masaki ; Naito, Sunao ; Someya, Hiroyuki ; Oowada, Isao ; Yoshimori, Shigeru ; Yoshimura, Kazuyuki ; Davis, Peter
Author_Institution :
Dept. of lnfomation & Comput. Sci., Saitama Univ., Saitama, Japan
fYear :
2009
fDate :
14-19 June 2009
Firstpage :
1
Lastpage :
1
Abstract :
Fast and reliable generation of non-deterministic random numbers is needed to improve the security of existing information and communication systems, including transactions on the internet and distributed data storage systems. Realising practical quantum key distribution systems in the future will also require high-speed generation of random sequences to modulate transmission parameters. Random physical phenomena, such as quantum optical noise and frequency jitter due to thermal noise in electronic oscillators, have been used as entropy sources for non-deterministic random number generation. However, rates of operation of non- deterministic generators have been limited to below around 10 Mbps, due to the difficulty of extracting bit sequences from physical noise at high rates without degrading statistical properties.
Keywords :
chaos; jitter; quantum cryptography; random number generation; random sequences; semiconductor lasers; thermal noise; chaotic semiconductor lasers; electronic oscillators; entropy sources; fast random bit sequence generation; frequency jitter; high-speed generation; nondeterministic random numbers; quantum key distribution systems; quantum optical noise; random sequences; thermal noise; transmission parameters; Chaos; Chaotic communication; Communication system security; Data security; Information security; Noise generators; Optical noise; Random number generation; Semiconductor device noise; Semiconductor lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
Type :
conf
DOI :
10.1109/CLEOE-EQEC.2009.5191703
Filename :
5191703
Link To Document :
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