• DocumentCode
    2778521
  • Title

    New Nano-Thermal Interface Materials (Nano-TIMs) with SiC Nano-Particles Used for Heat Removal in Electronics Packaging Applications

  • Author

    Wang, Wen Xuan ; Lu, Xiuzhen ; Liu, Johan ; Olorunyomi, Michael Olugbenga ; Aronsson, Tomas ; Shangguan, Dongkai

  • Author_Institution
    Shanghai Univ., Shanghai
  • fYear
    2006
  • fDate
    11-14 Dec. 2006
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Heat dissipation of semiconductor packages has become one of the limiting factors in miniaturization. A new Nano Thermal Interface Material (Nano-TIM) with potential high thermal conductivity and excellent mechanical properties manufactured by electrospinning process has been published earlier. In the present work, SiC nano-particles were added into the electrospinning solution to improve the thermal conductivity of the film. The produced Nano-TIM has a nano scale structure with embedded nano-SiC distributed randomly. Scanning Electrical Microscope (SEM) was used to determine the morphology of the film. Thermal properties were measured. The results show that the Nano-TIM has good thermal properties and it can be further improved by changing the mass concentration of the SiC nano particles.
  • Keywords
    electronics packaging; nanoparticles; scanning electron microscopy; silicon compounds; thermal properties; SiC; electronics packaging; electrospinning solution; embedded nanoSiC; heat removal; mass concentration; nanoparticles; nanothermal interface materials; scanning electrical microscope; thermal conductivity; thermal properties; Conducting materials; Electronic packaging thermal management; Electronics packaging; Mechanical factors; Nanostructured materials; Scanning electron microscopy; Semiconductor device packaging; Semiconductor materials; Silicon carbide; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
  • Conference_Location
    Kowloon
  • Print_ISBN
    978-1-4244-0834-4
  • Electronic_ISBN
    978-1-4244-0834-4
  • Type

    conf

  • DOI
    10.1109/EMAP.2006.4430688
  • Filename
    4430688