Title :
Scattering by pyramidal reflection gratings
Author :
Cai, L. ; Jull, E.V. ; Deleuil, R.
Author_Institution :
University of British Columbia, Vancouver, Canada
Keywords :
Area measurement; Diffraction gratings; Frequency; Millimeter wave measurements; Optical reflection; Optical scattering; Optimized production technology; Polarization; Power measurement; Tellurium;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1984
Conference_Location :
Boston, MA, USA
DOI :
10.1109/APS.1984.1149293