DocumentCode :
2778774
Title :
Determining the expected time to unsafe failure
Author :
Smith, D. Todd ; DeLong, Todd A. ; Johnson, Barry W. ; Giras, Ted C.
Author_Institution :
Dept. of Electr. Eng., Virginia Mil. Inst., Lexington, VA, USA
fYear :
2000
fDate :
2000
Firstpage :
17
Lastpage :
24
Abstract :
The number of applications requiring highly reliable and/or safety-critical computing is increasing. One emerging safety metric is the Mean Time To Unsafe Failure (MTTUF). This paper summarizes a novel technique for determining the MTTUF for a given architecture. The first step in determining the MTTUF for a system is to estimate system Mean Time To Failure (MTTF) and system fault coverage. Once these two parameters are known then the system MTTUF can be calculated. The presented technique allows MTTF and system coverage to be estimated from dependability models that incorporate time varying failure and/or repair rates. Existing techniques for the estimation of MTTUF require constant rate dependability models. For the sake of simplicity, this paper uses Markov models to calculate MTTUF. The presented approach greatly simplifies the calculation of system MTTUF. Finally a comparison is made between reliability expected time metrics (MTTF and MTBF) and safety expected time metrics (MTTUF and MTBUF)
Keywords :
Markov processes; safety-critical software; MTTF; MTTUF; Markov models; Mean Time To Failure; Mean Time To Unsafe Failure; constant rate dependability models; dependability models; expected time to unsafe failure; highly reliable computing; reliability expected time metrics; repair rates; safety expected time metrics; safety metric; safety-critical computing; system fault coverage; time varying failure; Art; Computer applications; Computer architecture; Military computing; Performance analysis; Rails; Railway safety; Steady-state; Time varying systems; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Assurance Systems Engineering, 2000, Fifth IEEE International Symposim on. HASE 2000
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7695-0927-4
Type :
conf
DOI :
10.1109/HASE.2000.895435
Filename :
895435
Link To Document :
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