Title :
Integration of system dependability and software reliability growth models for e-commerce systems
Author :
Hecht, Myron ; He, Yutao ; Hecht, Herbert ; An, Xuegao
Author_Institution :
SoHaR Inc., Beverly Hills, CA, USA
Abstract :
This paper describes how MEADEP (http//:www.sohar.com/meadep) a system level dependability prediction tool, and SMERFS (Farr and Smith, 1993), a software reliability growth prediction tool can be used together to predict system reliability, availability growth for complex systems. The Littlewood/Verrall model is used to predict reliability growth from software test data. This prediction is integrated into a system level Markov model that incorporates WAN (Internet) service interruptions, hardware failures and recoveries, redundancy, coverage failures and capacity. The results of the combined model can be used to predict the contribution of additional testing upon availability, the economic value of additional testing, and a variety of other figures of merit that support management decisions
Keywords :
Internet; Markov processes; electronic commerce; software reliability; software tools; Internet; MEADEP; SMERFS; WAN; complex systems; dependability prediction tool; e-commerce; electronic commerce; hardware failure; hardware recovery; redundancy; service interruptions; software reliability growth models; software test data; system level Markov model; Application software; Availability; Frequency estimation; Hardware; Predictive models; Redundancy; Software reliability; Software testing; Web and internet services; Wide area networks;
Conference_Titel :
High Assurance Systems Engineering, 2000, Fifth IEEE International Symposim on. HASE 2000
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7695-0927-4
DOI :
10.1109/HASE.2000.895437
