• DocumentCode
    2778824
  • Title

    Function estimation for multiple indices trend analysis using self-organizing mapping

  • Author

    Zhang, Siyu

  • Author_Institution
    Dept. of Mech. Eng., Concordia Univ., Montreal, Que., Canada
  • fYear
    1994
  • fDate
    6-10 Nov. 1994
  • Firstpage
    160
  • Lastpage
    165
  • Abstract
    Since system conditions can be indicated by a group of machine signal features but not any individual index, multiple indices trend analysis has foundational importance in system monitoring and diagnosis for factory automation. The author proposes to employ self-organizing neural network method to perform trend analysis in multi-dimensional space as an original exploration. However, experiments show that Kohonen´s learning algorithm and constrained topological mapping algorithm may yield nonfunctional maps in such a prediction analysis. An improvement on them by unequal scaling the training data can protect the topological order of netted neurons from being violated. This new approach achieves more accurate results than the widely used single-variable trend analysis method, and is suitable for interpolation for a large number of data and extrapolation in few data cases. The proposed approach is actually a general algorithm which can be widely used in high-dimensional line function regression.<>
  • Keywords
    factory automation; fault diagnosis; monitoring; self-organising feature maps; signal processing; statistical analysis; Kohonen learning algorithm; constrained topological mapping; extrapolation; factory automation; function estimation; interpolation; machine signal features; multidimensional space; multiple indices trend analysis; self-organizing mapping; self-organizing neural network; system diagnosis; system monitoring; unequal scaling; Algorithm design and analysis; Computerized monitoring; Condition monitoring; Manufacturing automation; Neural networks; Neurons; Performance analysis; Protection; Signal analysis; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Technologies and Factory Automation, 1994. ETFA '94., IEEE Symposium on
  • Conference_Location
    Tokyo, Japan
  • Print_ISBN
    0-7803-2114-6
  • Type

    conf

  • DOI
    10.1109/ETFA.1994.402008
  • Filename
    402008