• DocumentCode
    2778934
  • Title

    Accuracy enhancement of the Whispering Gallery mode resonator method using substrates with identical sizes to measure the conductivity and the complex permittivity

  • Author

    Huong, Tran Thi ; Hirokawa, Jiro ; Kogami, Yoshinori ; Ando, Makoto

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Tokyo
  • fYear
    2008
  • fDate
    5-11 July 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We have enhanced the WG mode resonator method by using the substrates with the same thickness to evaluate the conductivity and the complex permittivity in the same frequency band. Using the proposed technique we investigate frequency dependencies of PTFE substrate with three types of copper-foils in 55 to 70 GHz band. In the conventional measurements, the conductivity of electrodeposited copper foils is 56% of the value of the international standard annealed copper. However when we used substrates with the same thickness for the measurement the conductivity of electrodeposited copper foil is 35%.
  • Keywords
    permittivity; resonators; Whispering Gallery mode resonator method; accuracy enhancement; complex permittivity; electrodeposited copper foils; frequency 55 GHz to 70 GHz; international standard annealed copper; Conductivity measurement; Copper; Dielectric measurements; Dielectric substrates; Electromagnetic waveguides; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Size measurement; Whispering gallery modes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-2041-4
  • Electronic_ISBN
    978-1-4244-2042-1
  • Type

    conf

  • DOI
    10.1109/APS.2008.4619973
  • Filename
    4619973