DocumentCode
2778934
Title
Accuracy enhancement of the Whispering Gallery mode resonator method using substrates with identical sizes to measure the conductivity and the complex permittivity
Author
Huong, Tran Thi ; Hirokawa, Jiro ; Kogami, Yoshinori ; Ando, Makoto
Author_Institution
Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Tokyo
fYear
2008
fDate
5-11 July 2008
Firstpage
1
Lastpage
4
Abstract
We have enhanced the WG mode resonator method by using the substrates with the same thickness to evaluate the conductivity and the complex permittivity in the same frequency band. Using the proposed technique we investigate frequency dependencies of PTFE substrate with three types of copper-foils in 55 to 70 GHz band. In the conventional measurements, the conductivity of electrodeposited copper foils is 56% of the value of the international standard annealed copper. However when we used substrates with the same thickness for the measurement the conductivity of electrodeposited copper foil is 35%.
Keywords
permittivity; resonators; Whispering Gallery mode resonator method; accuracy enhancement; complex permittivity; electrodeposited copper foils; frequency 55 GHz to 70 GHz; international standard annealed copper; Conductivity measurement; Copper; Dielectric measurements; Dielectric substrates; Electromagnetic waveguides; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Size measurement; Whispering gallery modes;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
Conference_Location
San Diego, CA
Print_ISBN
978-1-4244-2041-4
Electronic_ISBN
978-1-4244-2042-1
Type
conf
DOI
10.1109/APS.2008.4619973
Filename
4619973
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